News - Date: 2017.04.18
JTAG/Boundary Scan - training day
JTAG/Boundary Scan is possibly the most resourceful test technology. Similar to the In-Circuit Test (ICT) but without physical nail contact with all nets, it utilizes virtual test points to detect the failure location—even under BGAs and on high-speed nets.
DSE now offers a number of Boundary Scan training to get you acquainted with this important technology.
Learn about:
- Introduction to Boundary Scan
- Design for Test (DfT)
- Debug and verification of prototypes
- Test and programming of NPI
- Reuse of tests in manufacturing testing
Read the invitation for 1 day training session here